Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
DFT 2026
About this Conference
An annual symposium focusing on defect and fault tolerance in VLSI and nanotechnology systems. The conference bridges academic research with industrial insights, exploring advances in design, manufacturing, testing, and reliability of electronic systems.
Call for Papers
The symposium seeks papers on a wide range of topics including yield analysis, testing techniques, design for testability, error detection and correction, dependability analysis, repair strategies, fault tolerance, aging effects, emerging technologies, RISC-V architectures, and design for security. Submissions should address innovative approaches to reliability, availability, and performance of electronic systems across various domains.